The PEEK chip test holder is the core insulating component of semiconductor chip testing fixtures, specifically designed for BGA (Ball Grid Array) and IC (Integrated Circuit) aging test and functional verification scenarios. The product is manufactured using high-performance PEEK (Polyetheretherketone) special engineering plastic. The material features excellent electrical insulation, high temperature resistance, chemical corrosion resistance, low creep, and strong dimensional stability, ensuring stable positional accuracy in repeated high and low temperature cycling test environments.
We can provide customized services throughout the entire process, including design, material selection and modification, mold manufacturing, injection molding, and machining, according to the different needs of our customers.
| Test items | Test standards | Test conditions | Company | njsspeek-1000 | njsspeek-g1030 | njsspeek-c1030 |
|---|---|---|---|---|---|---|
| Pure resin | 30% glass fiber | 30% carbon fiber | ||||
| Density | ISO1183 | Crystal | g/cm3 | 1.3 | 1.51 | 1.4 |
| Density | ISO1183 | Crystal | g/cm3 | 1.3 | 1.51 | 1.4 |
| Density | ISO1183 | Crystal | g/cm3 | 1.3 | 1.51 | 1.4 |
| Density | ISO1183 | Crystal | g/cm3 | 1.3 | 1.51 | 1.4 |
| Density | ISO1183 | Crystal | g/cm3 | 1.3 | 1.51 | 1.4 |
| Product name | Product specification | |
|---|---|---|
| OD | ID | |
| φ4*1000 | φ4*1000 | φ4*1000 |
| φ4*1000 | φ4*1000 | φ4*1000 |
| φ4*1000 | φ4*1000 | φ4*1000 |
| φ4*1000 | φ4*1000 | φ4*1000 |
| Diameter * Length (mm) | Weight (kg/m) | Diameter * Length (mm) | Weight (kg/m) |
|---|---|---|---|
| φ4*1000 | 0.02 | φ60*1000 | 3.7 |
| φ4*1000 | 0.02 | φ60*1000 | 3.7 |
| φ4*1000 | 0.02 | φ60*1000 | 3.7 |
| φ4*1000 | 0.02 | φ60*1000 | 3.7 |
| φ4*1000 | 0.02 | φ60*1000 | 3.7 |