PEEK Chip Test Holder

The PEEK chip test holder is the core insulating component of semiconductor chip testing fixtures, specifically designed for BGA (Ball Grid Array) and IC (Integrated Circuit) aging test and functional verification scenarios. The product is manufactured using high-performance PEEK (Polyetheretherketone) special engineering plastic. The material features excellent electrical insulation, high temperature resistance, chemical corrosion resistance, low creep, and strong dimensional stability, ensuring stable positional accuracy in repeated high and low temperature cycling test environments.

We can provide customized services throughout the entire process, including design, material selection and modification, mold manufacturing, injection molding, and machining, according to the different needs of our customers.

Performance Table

   

Test itemsTest standardsTest conditionsCompanynjsspeek-1000njsspeek-g1030njsspeek-c1030
Pure resin30% glass fiber30% carbon fiber
DensityISO1183Crystalg/cm31.31.511.4
DensityISO1183Crystalg/cm31.31.511.4
DensityISO1183Crystalg/cm31.31.511.4
DensityISO1183Crystalg/cm31.31.511.4
DensityISO1183Crystalg/cm31.31.511.4
Specification table
Product nameProduct specification
ODID
φ4*1000φ4*1000φ4*1000
φ4*1000φ4*1000φ4*1000
φ4*1000φ4*1000φ4*1000
φ4*1000φ4*1000φ4*1000
Diameter * Length
(mm)
Weight
(kg/m)
Diameter * Length
(mm)
Weight
(kg/m)
φ4*10000.02φ60*10003.7
φ4*10000.02φ60*10003.7
φ4*10000.02φ60*10003.7
φ4*10000.02φ60*10003.7
φ4*10000.02φ60*10003.7
yw@njsspeek.com
+8613851736850